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Test equipment

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Test equipment

business case analysis (BCA)

Semiconductors; Test equipment

The fundamental process to analyze Operational and Support design and strategy decisions. A BCA provides a best-value analysis that considers not only cost, but other quantifiable and ...

binary decision diagram (BDD)

Semiconductors; Test equipment

A method of representing Boolean equations as decision trees.

background debug mode interface (BDM)

Semiconductors; Test equipment

An electronic interface that allows debugging of embedded systems. Specifically, it provides in-circuit debugging functionality in microcontrollers. It requires a single wire and specialized ...

bit error rate (BER)

Semiconductors; Test equipment

In a digital transmission, BER is the percentage of bits with errors divided by the total number of bits that have been transmitted, received or processed over a given time period. The rate is ...

bit error rate tester (BERT)

Semiconductors; Test equipment

A procedure or device that measures the bit error rate of a transmission.

ball grid array (BGA)

Semiconductors; Test equipment

A component whose terminations are on the bottom of the package, and are in the shape of solder balls and in a grid array pattern. This generally covers components that have them in a full array or ...

built In logic block observer (BILBO)

Semiconductors; Test equipment

A BILBO is a multitalented logic circuit that can be a state register, a scan register, an LFSR, or a MISR depending on the state of its mode pins. BILBOs are sometimes used to cascade large ...

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