12 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
boundary scan (BScan/JTAG)
Semiconductors; Test equipment
Boundary Scan means no less than "getting rid of the nail", so the bed-of-nail adaptation getting more and more difficult is dropped but the advantage is maintained, i.e. the testing within the ...
boundary-scan description language (BSDL)
Semiconductors; Test equipment
A language, similar to and a subset of VHDL, used by semiconductor vendors to describe the boundary-scan behavior of their IEEE 1149.1-compliant devices.
boundary scan register (BSR)
Semiconductors; Test equipment
A serial shift register of Boundary-Scan cells that is used to observe and control the pins of a chip.
bypass register (BSR)
Semiconductors; Test equipment
A single-bit register applied in parallel to the BSR that reduces the device’s scan shift-path to only 1 bit.
criticality analysis (CA)
Semiconductors; Test equipment
A procedure by which each potential failure mode is ranked according to the combined influence of severity and probability of occurrence.
computer aided accuracy (CAA)
Semiconductors; Test equipment
Automatic consideration of the systematic residual deviations determined by highly exact measurement.
computer aided design (CAD)
Semiconductors; Test equipment
A computer based system to assist designers in the design, topological layout and drawing of an electronic component, assembly, or system.
