6 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
alias frequency
Semiconductors; Test equipment
A false lower-frequency component that appears in analog data that is reconstructed from original data digitized at an insufficiently high sampling rate.
asynchronous transfer mode (ATM)
Semiconductors; Test equipment
A fast-packet switching technology that uses asynchronous time-division multiplexing.
fault dictionary
Semiconductors; Test equipment
A fault dictionary contains the same information contained in a fault list, but include information about how the fault manifests itself including the error location and its effect on circuit ...
non-observable fault
Semiconductors; Test equipment
A fault is considered non-observable if its effects cannot be measured at any network output.
fault list
Semiconductors; Test equipment
A fault list that contains every possible fault for consideration, but no information bout how the fault manifests itself under various circuit conditions and test conditions.
passive filter
Semiconductors; Test equipment
A filter circuit using only passive components such as resistors, capacitors, and inductors.
anti-alias filter
Semiconductors; Test equipment
A filter that attenuates noise and high-frequency components of an analog signal prior to its conversion into a digital value.
